<?xml version='1.0' encoding='UTF-8'?><?xml-stylesheet href="http://www.blogger.com/styles/atom.css" type="text/css"?><feed xmlns='http://www.w3.org/2005/Atom' xmlns:openSearch='http://a9.com/-/spec/opensearchrss/1.0/' xmlns:georss='http://www.georss.org/georss' xmlns:gd='http://schemas.google.com/g/2005' xmlns:thr='http://purl.org/syndication/thread/1.0'><id>tag:blogger.com,1999:blog-6602621714986664892</id><updated>2012-02-16T21:43:08.828+08:00</updated><title type='text'>Electronic Test Equipment</title><subtitle type='html'>Electronic test equipment (sometimes called "testgear") is used to create signals and capture responses from electronic Devices Under Test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced and repaired. Use of electronic test equipment is essential to any serious work on electronics systems.</subtitle><link rel='http://schemas.google.com/g/2005#feed' type='application/atom+xml' href='http://electronictestequipmentblog.blogspot.com/feeds/posts/default'/><link rel='self' type='application/atom+xml' href='http://www.blogger.com/feeds/6602621714986664892/posts/default?max-results=100'/><link rel='alternate' type='text/html' href='http://electronictestequipmentblog.blogspot.com/'/><link rel='hub' href='http://pubsubhubbub.appspot.com/'/><author><name>SPECTRA94</name><email>noreply@blogger.com</email><gd:image rel='http://schemas.google.com/g/2005#thumbnail' width='16' height='16' src='http://img2.blogblog.com/img/b16-rounded.gif'/></author><generator version='7.00' uri='http://www.blogger.com'>Blogger</generator><openSearch:totalResults>0</openSearch:totalResults><openSearch:startIndex>1</openSearch:startIndex><openSearch:itemsPerPage>100</openSearch:itemsPerPage></feed>
